On-wafer Microwave Measurements and De-embedding (pdf)

Description

This book bridges the gap between theoretical and practical information using real-world practices that address all aspects of on-wafer passive device characterization in the microwave frequency range up to 60GHz. Readers find data and measurements from silicon integrated passive devices fabricated and tested in advanced CMOS technologies. Basic circuit equations, terms and fundamentals of time and frequency domain analysis are covered..,